Full Text:   <181>

Summary:  <52>

CLC number: TN402

On-line Access: 2024-05-06

Received: 2023-07-05

Revision Accepted: 2024-05-06

Crosschecked: 2023-12-17

Cited: 0

Clicked: 203

Citations:  Bibtex RefMan EndNote GB/T7714

 ORCID:

Zhengzhou CAO

https://orcid.org/0009-0004-7988-1003

Guozhu LIU

https://orcid.org/0000-0003-4358-3309

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Article info.

Frontiers of Information Technology & Electronic Engineering  2024 Vol.25 No.4 P.485-499

http://doi.org/10.1631/FITEE.2300454


Design and verification of an FPGA programmable logic element based on Sense-Switch pFLASH


Author(s):  Zhengzhou CAO, Guozhu LIU, Yanfei ZHANG, Yueer SHAN, Yuting XU

Affiliation(s):  No. 58 Research Institute, China Electronics Technology Group Corporation, Wuxi 214035, China

Corresponding email(s):   caozhengzhou@163.com

Key Words:  Field programmable gate array (FPGA), Programmable logic element (PLE), Boolean logic operation, Look-up table, Sense-Switch pFLASH, Threshold voltage


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Zhengzhou CAO, Guozhu LIU, Yanfei ZHANG, Yueer SHAN, Yuting XU. Design and verification of an FPGA programmable logic element based on Sense-Switch pFLASH[J]. Frontiers of Information Technology & Electronic Engineering, 2024, 25(4): 485-499.

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doi="10.1631/FITEE.2300454"
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A1 - Yuting XU
J0 - Frontiers of Information Technology & Electronic Engineering
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Abstract: 
This paper proposes a kind of programmable logic element (PLE) based on sense-Switch pFLASH technology. By programming sense-Switch pFLASH, all three-bit look-up table (LUT3) functions, partial four-bit look-up table (LUT4) functions, latch functions, and d flip flop (DFF) with enable and reset functions can be realized. Because PLE uses a choice of operational logic (COOL) approach for the operation of logic functions, it allows any logic circuit to be implemented at any ratio of combinatorial logic to register. This intrinsic property makes it close to the basic application specific integrated circuit (ASIC) cell in terms of fine granularity, thus allowing ASIC-like cell-based mappers to apply all their optimization potential. By measuring sense-Switch pFLASH and PLE circuits, the results show that the “on” state driving current of the sense-Switch pFLASH is about 245.52 μA, and that the “off” state leakage current is about 0.1 pA. The programmable function of PLE works normally. The delay of the typical combinatorial logic operation AND3 is 0.69 ns, and the delay of the sequential logic operation DFF is 0.65 ns, both of which meet the requirements of the design technical index.

基于Sense-Switch型pFLASH的FPGA可編程邏輯單元的

設計與驗證
曹正州,劉國柱,張豔飛,單悅爾,徐玉婷
中(zhōng)國電子科技集團公司第58研究所,中(zhōng)國無錫市,214035
摘要:本文提出一(yī)種基于Sense-Switch型pFLASH技術的可編程邏輯單元(PLE)。通過對Sense-Switch型pFLASH進行編程,實現所有的三位查找表(LUT3)功能、部分(fēn)LUT4功能、鎖存器功能以及帶使能和複位的DFF功能。因爲PLE使用了一(yī)種選擇運算邏輯(COOL)的方法來運算邏輯函數,它允許使用任意組合邏輯和寄存器的比例來實現任意邏輯電路。這一(yī)本質特性使其在精細粒度方面接近于基本的ASIC單元,從而允許類似ASIC的基于單元的映射器應用其所有的優化潛力。對Sense-Switch型pFLASH和PLE電路的實測結果表明Sense-Switch型pFLASH的"開(kāi)态"驅動電流約爲245.52 µA、"關态"漏電流約爲0.1 pA;PLE的可編程功能正常工(gōng)作;典型的組合邏輯運算AND3的延遲爲0.69 ns、時序邏輯DFF的延遲爲0.65 ns,均滿足設計技術指标的要求。

關鍵詞:現場可編程門陣列;可編程邏輯單元;布爾邏輯運算;查找表;Sense-Switch型pFLASH;阈值電壓

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

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